GB-Newcastle upon Tyne: T23/0029 - Focused Ion Beam Secondary Electron Microscope (FIB-SEM)

Concepts

• electron microscopes
• newcastle upon tyne
• microscopes
• ion microscopes
• scanning electron microscopes
• ion and molecular microscopes
• electron backscatter diffraction
• t23/0029 - focused ion beam secondary electron microscope
• a focused ion beam secondary electron microscope
• fib

Location

Description

The university is looking to purchase a focused ion beam secondary electron microscope (FIB-SEM) that can handle various samples from different fields including semiconductors, energy materials (such as batteries and photovoltaics), civil engineering, metallurgy, etc. The instrument must excel in analysing thin film multilayer structures and devices (e.g. thin film solar cells), which typically consist of layers ranging from 1 micron to less than 20nm thick, requiring 3-dimensional microstructure analysis. The instrument must have excellent imaging capabilities, as well as the ability to handle Energy Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) investigations. We also require a TOF-SIMS detector and electron beam-induced current (EBIC) electronics.

CPV Codes

• 38511000 - Electron microscopes
• 38510000 - Microscopes
• 38512100 - Ion microscopes
• 38511100 - Scanning electron microscopes
• 38512000 - Ion and molecular microscopes

Other Information

Please follow this link to view the notice https://www.delta-esourcing.com/tenders/UK-GB-Newcastle-upon-Tyne:-T23/0029---Fo...