3022/JN - Scanning Electron Microscope (SEM) with Microanalysis Capability

Concepts

• scanning electron microscopes
• sheffield
• department of materials science and engineering
• high throughput electron beam
• scanning electron microscope
• required sem
• sem
• microanalysis capability
• university of sheffield
• overarching requirement

Location

Description

The University of Sheffield's Department of Materials Science and Engineering with funding from the EPSRC are looking to procure a scanning electron microscope (SEM). The required SEM will provide an underpinning multi-user environment with which to perform high throughput electron beam imaging to nm resolution with an ability for simultaneous X-ray compositional analysis (EDS) of a broad range of materials. These materials include, but not restricted to, metals, ceramics, polymers/biomaterials and glasses. The instrument must include the ability to image non-conducting or beam sensitive materials though variable accelerating voltage and pressure modes. An overarching requirement is the instrument will offer a modern accessible interface for ease of use, particularly for neurodiverse users. Potential suppliers should note that the instrument may be utilised for imaging and analysis of low activity radioactive specimens, containing uranium or thorium, primarily as solid samples.

CPV Codes

• 38511100 - Scanning electron microscopes

Indicators

• Contract is suitable for SMEs.
• Contract is suitable for VCOs.

Other Information

This is an open exercise. The ITT can be downloaded by registering and expressing your interest on the University`s e-tendering system https://in-tendhost.co.uk/sheffield If you have any questions or comments in relation to this tender they must be submitted via the In-tend system, this can be accessed at https://in-tendhost.co.uk/sheffield Completed tenders must be returned through the same e-tendering system. All documents can be accessed at: https://in-tendhost.co.uk/sheffield