Analytical Focused Ion Beam Scanning Electron Microscope

Concepts

• scanning electron microscopes
• sheffield
• electron microscope
• analytical focused ion beam scanning electron microscope
• , computer-controlled user friendly, focused ion beam
• analytical
• microscope
• ion
• scanning
• beam

Location

Description

This procurement is a min-competition against Lot 2 of the NWUPC Framework Agreement for High Value Laboratory Equipment (HVLE) Reference Number LAB3162 NW, conducted in accordance with the Public Contract Regulations 2015. The Nuclear AMRC seeks to purchase a state of the art, computer-controlled user friendly, focused ion beam (FIB) analytical field emission gun scanning electron microscope (SEM). The instrument will be used for the high resolution imaging primarily of metals, including metals whose mechanical properties depend on very fine (< 10 nm) microstructural elements.

Award Detail

CPV Codes

• 38511100 - Scanning electron microscopes

Indicators

• Contract is suitable for SMEs.